Functional Behaviour Compare -
Normal Designs vs Self Fault Correcting Designs in a Real Environment

Technology Benefits

Benefits of Fault Resilient, High Stable Electronics over Conventional Electronics

Benefits Comparison of Old Technology with All New Fault Resilient, High Stable Technology
Source of Semiconductor Faults - Electromagnetic Hazards

Details of Different Sources which create Semiconductor Faults.
Different Type of Electromagnetic Noise and hazards which distract digital Circuits.

Testing a Self Fault Correcting Technology -

Effect of Faults due to Electromagnetic Noise on Real Circuits – A Comparison.

Comparison of a Simple Shift Register with a Fault Resilient, Fault Tolerant, High Stable Shift Register.

Comparison of a Normal Counter with Fault Resilient, Fault Tolerant, High Stable Counter.
Testing on CRO, A Fault Resilient vs High Stable IP

Comparison of Fault Resilient, Fault Tolerant, Self fault correcting, High Stable Timers with Standard Timers IP over a CRO.
Comparing a Fault Resilient, High Stable IP

Demonstration of Fault Resilient, Fault Tolerant, High Stable Timers with Standard Timers IP.
A Deep View inside Fault Resilient, High Stable Timers IP.
Benefits of Fault Resilient, High Stable timers IP from System Standpoint.
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